Estimation of the Young's Modulus of Nanometer-Thick Films Using Residual Stress-Driven Bilayer Cantilevers

Added 116 days ago (21.01.2022)
Authors: Luis A Velosa-Moncada; Jean-Pierre Raskin; Luz Antonio Aguilera-Cortés; Francisco López-Huerta; Agustín L Herrera-May
Journal: Nanomaterials
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